09/12/2022 Community Activities
Noida: “Fashion is part of the daily air and it changes all the time, with all the events. You can even see the approaching of a revolution in clothes. You can see and feel everything in clothes. What you wear is how you present yourself to the world, especially today, when human contacts are so quick. Fashion is instant language,” said Sandeep Marwah President of AAFT School of Fashion and Design in the master class introducing the renowned fashion designer Ashish Soni at Marwah Studios, Noida Film City.
“Rome was not built in a day. Every garment represents you. Every show adds on to your goodwill and popularity. Nothing comes without passion. You have to be honest to your profession,” said Ashish Soni explaining his journey to success. The numerous exposures to the various international forums have refined his artistic skills. He was the first Indian designer to be invited at the Olympus Fashion Week, held in New York.
Ashish Soni has attained remarkable success in the global fashion world. Creativity of a designer and traits of an entrepreneur have been beautifully gelled together, which makes him a big name in the industry.
His innovativeness has a strong Indian bond that has been well merged with the western education, to give a perfect balance of Indian and western style creations. Ashish Soni’s instinctive and inventive style of creating garments makes them an elegant piece of attire.
Noida: “Fashion is part of the daily air and it changes all the time, with all the events. You can even see the approaching of a revolution in clothes...
Noida: “Fashion is the most general term and applies to any way of dressing, behaving, writing, or performing that is favored at any one time or place...
Noida – The AAFT School of Fashion and Design made a resplendent mark at the Style Odyssey exhibition with a showcase of exquisite garments and a spir...
Noida: In a dazzling showcase of cultural exchange and artistic collaboration, the International Chamber of Media and Entertainment Industry (ICMEI) j...
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